Main benefits of AFM in SEM


Brochures and Leaflets


LiteScope brochure

LiteScope™ is a unique Atomic Force Microscope (AFM) designed for „plug & play“ integration into the Scanning Electron Microscopes (SEMs).

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Nanoindenter leaflet

The combination of AFM, SEM and nanoindenter represents a unique solution, enabling a wide range of novel and complex applications.

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LiteScope's measurement modes

What can LiteScope do? See an overview of its measurement modes!

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Application Notes


CPEM

CPEM, i.e. Correlative Probe and Electron Microscopy, is a revolutionary technology enabling seamless in-time correlation of AFM and SEM images. See its applications and learn more about it!

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Unique applications

LiteScope’s unique applications represent measurements, where the simultaneous utilization of an SEM and an AFM is either completely indispensable or vastly superior to the use of separate conventional instruments.

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2D materials

The analysis of 2D materials can be challenging due to various issues, like the sample size, thickness, poor SEM contrast of the thin layers, etc. LiteScope represents the best possible solution on how to deal with them.

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Videos


LiteScope - AFM for SEM

Product video of our AFM for SEMs LiteScope, explaining its principal features, applications and parameters.

Explore CPEM

Watch our video explaining CPEM technology, a novel method of multidimensional correlative imaging. It enables simultaneous acquisition of data from SEM and AFM, that can be easily correlated into a 3D image.

Webinar: Correlative microscopy AFM in SEM

Watch a webinar dedicated to more complex presentation of LiteScope, its strengths, unique features and applications.

Gallery


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