Main benefits of AFM in SEM
Complex and correlative sample analysisUnique method of multidimensional correlative imaging (CPEM) enables simultaneous acquisition of the data from SEM and AFM, and their seamless correlation into 3D images.
Results of in-situ analysis are not influenced by different external conditionsAll measurements are done at the same time, in the same place and under the same conditions, preventing the need of sample transfer and risk of contamination during analyses.
Precise localization of the region of interestSave time by using SEM to localize and navigate the AFM to the region of interest.
Brochures and Leaflets
LiteScope brochure
LiteScope™ is a unique Atomic Force Microscope (AFM) designed for „plug & play“ integration into the Scanning Electron Microscopes (SEMs).
Nanoindenter leaflet
The combination of AFM, SEM and nanoindenter represents a unique solution, enabling a wide range of novel and complex applications.
LiteScope's measurement modes
What can LiteScope do? See an overview of its measurement modes!
Application Notes
CPEM
CPEM, i.e. Correlative Probe and Electron Microscopy, is a revolutionary technology enabling seamless in-time correlation of AFM and SEM images. See its applications and learn more about it!
Unique applications
LiteScope’s unique applications represent measurements, where the simultaneous utilization of an SEM and an AFM is either completely indispensable or vastly superior to the use of separate conventional instruments.
2D materials
The analysis of 2D materials can be challenging due to various issues, like the sample size, thickness, poor SEM contrast of the thin layers, etc. LiteScope represents the best possible solution on how to deal with them.
Videos
LiteScope - AFM for SEM
Product video of our AFM for SEMs LiteScope, explaining its principal features, applications and parameters.
Explore CPEM
Watch our video explaining CPEM technology, a novel method of multidimensional correlative imaging. It enables simultaneous acquisition of data from SEM and AFM, that can be easily correlated into a 3D image.
Webinar: Correlative microscopy AFM in SEM
Watch a webinar dedicated to more complex presentation of LiteScope, its strengths, unique features and applications.
Gallery
With LiteScope you can combine whatever we see in the SEM with whatever the AFM delivers. It's like having a swiss army knife inside the chamber of the SEM.Prof. Marc-Georg Willinger, Group leader in ScopeM, ETH Zürich
Considering the wide range of measuring modes NenoVison's AFM-in-SEM system is offering, it will open the door to correlative materials characterization. Prof. Ehrenfried Zschech, Head of the Steering Committee, Dresden Fraunhofer IKTS
LiteScope is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective.Antonín Fejfar, Deputy director of the Institute of Physics, Czech Academy of Sciences
Easy localization of the area of interest using the SEM and following local characterization of the surface by the AFM provided us with topographical information about features and behavior of our samples in a vacuum and in air.Dinara Sobola, Researcher in the Optoelectronic Characterisation of Nanostructures group, CEITEC Brno, University of Technology
NenoVision’s novel CPEM technology helped us gain unique 3D information about our nano-sized samples deposited on cm-sized substrates. The unique ability to utilize both SEM and AFM at the same time allowed us to directly correlate the size and mechanical properties of silk nanowires.Prof. Wouter Metsola van der Wijngaart, Deputy head of Department of Micro and Nanosystems, KTH Royal Institute of Technology, Sweden
We implement the AFM in SEM technology in the field of low dimensional materials research. The correlative AFM in SEM microscopy embodied in LiteScope opens up a brand new dimension of knowledge about these materials' properties and their optimization.Prof. Michal Otyepka, Vice-Director of the Regional Centre of Advanced Technologies and Materials, Olomouc
The extraordinary level of expertise and scientific knowledge that I found in NenoVision is fundamental for my project and the high quality of the imaging obtained with LiteScope has produced outstanding results so far.Marco Cassani, Researcher at the Cardiovascular System Mechanobiology Group, St. Ann's University Hospital Brno